Zoller Conducts Presentation of Newest Genius Model May 19, 2021 Zoller Inc., Ann Arbor, Mich., today conducted an online demonstration of its newest version of its Genius tool inspection machine.
Felsomat USA to Host Innovation Day on June 10 June 7, 2021 Felsomat USA will host Innovation Day on June 10 at its U.S. headquarters in Schaumburg.
Enhanced X-ray CT from Nikon for Large Components May 28, 2021 Nikon Metrology’s industrial microfocus X-ray CT inspection solutions now enhanced with a new offset CT reconstruction algorithm to deliver faster scan speed and image resolution.
New Data Collection Technology Ensures Speed, Accuracy, Scalability and Security May 21, 2021 Roush Yates Engines explored ways to improve the accuracy, integrity and throughput of its measurement data, and decided to implement DataSure 4.0, a data acquisition solution developed by The L.S. Starrett Co.
ZEISS to Acquire Capture 3D May 11, 2021 ZEISS said it has agreed to acquire Capture 3D. Financial terms were not disclosed.
Legal Insights for the Metals Industry April 15, 2021 Two attorneys explain why a strong sales contract is a necessity in the metals industry.
Tenured robotics integrator turns on a dime to help manufacturers do the same April 5, 2021 In October, in the middle of the coronavirus pandemic, a smaller machine shop in Wisconsin needed a robot to deburr parts—and fast.
Keyence Launches IM-8000 Dimensional Measurement System May 19, 2021 The IM-8000 dimensional measurement system has a rotary unit, which allows for 360-degree measurement capability on both turned and machined parts.
FABTECH to Return to Chicago’s McCormick Place in September June 21, 2021 FABTECH will be the first large-scale manufacturing trade show to return to McCormick Place in Chicago, September 13-16. The announcement comes as the state of Illinois moves into its final reopening phase.
Starrett Appoints Jim VandeHei Director of Sales, Metrology Systems April 6, 2021 The L.S. Starrett Company has appointed Jim VandeHei Director of Sales, Starrett Metrology Systems.