Zeiss Receives ACEC Award for Wixom Quality Excellence Center March 8, 2021 In a statement, Zeiss Industrial Quality Solutions says it opened its Wixom, Mich.-based Quality Excellence Center.
Creaform Releases the Handyscan 3d Silver Line-Up March 4, 2021 The new series of handheld 3D scanners is aimed at professionals and small businesses.
Hexagon Debuts AS1 Laser Scanner at FABTECH 2021 September 3, 2021 Hexagon’s Manufacturing Intelligence division announced the North American debut of its AS1 Scanner will be held at FABTECH 2021, Sept. 13-16, 2021, McCormick Place, Chicago, IL. In Booth A3326 in the South Building.
Sandvik to Acquire DWFritz Automation July 15, 2021 Sandvik will acquire DWFritz Automation, a U.S.-based provider of precision metrology, inspection and assembly solutions for advanced manufacturing. DWFritz designs, builds and supports high-speed, non-contact metrology solutions and automation systems.
Mitutoyo America Corporation Releases AI Inspect Software April 1, 2021 Mitutoyo America Corporation releases new Mitutoyo AI Inspect Software to its lineup of software solutions
Siemens extends Xcelerator portfolio with quality management January 27, 2021 Teamcenter Quality software, now provides a closed-loop approach for quality management.
Easy Setups with Automated On-Machine Probing December 7, 2021 Machine operators can replace time-consuming manual setups and gauging with the precision of digital metrology through a conversational CNC interface.
OSB giant understands value of digital thread is not TBD November 30, 2021 How the digital thread increases visibility of upstream and downstream workflows.
Making work safer, healthier one data point at a time November 23, 2021 As broad-based adoption of wearable tech grows, it is not a stretch to think that in a few years we will have enough predictive data to dramatically reduce workplace injuries and fatalities.
Reverse Engineering Proliferates: New Applications Emerge as Technology Improves October 13, 2021 Reverse engineering is becoming multifaceted and complex. The key drivers: new metrology sensors and more capable software, enabled by ever more powerful and cheaper computing.