Skip to content
SME Search Search Results

Displaying 51-60 of 713 results for

Software clear Measurement & Metrology clear Stamping clear Forming & Fabricating clear Robotics clear Casting clear Welding & Cutting clear

DP Technology Introduces Updated CAM Software for 2020

DP Technology has announced a comprehensive product update, called ESPRIT 2020, for its computer-aided manufacturing (CAM) software. Among the most significant developments are updates to the software’s computer-aided design (CAD) interfaces and new or improved solutions for specific machine tools.

The Anatomy of a Telescopic Gauge

Telescoping gauges are indirect measuring devices used to measure the internal diameter of a bore, hole, groove, slot, etc. This T-shaped tool consists of a handle, two telescopic rods and a locking screw.

PLM Takes On Digital Transformation

Product lifecycle management (PLM) software helps manufacturers manage, shape, guide, and refine new product developments, speeding up the design and production process.

Quality Assurance Passes with Flying Colors at IMTS

The world of quality measurement devices and software continues to expand, and IMTS years are especially exciting times. If there is a theme in the many offerings—new devices, new software—it might be how quality devices are continuing to burrow their way into the heart of manufacturing on the shop floor.

Metrology Certifications in the Knowledge Age

Technology is changing ever more rapidly. Sometimes this means topics learned in engineering or technical school become obsolete. Whole new fields emerge within a few years, so that even those with freshly minted educations suddenly find themselves faced with new challenges.

Optical Metrology in Three Dimensions

Basic trends in modern manufacturing are driving growth in 3D optical metrology. “One is the highly complex and high-tech material that manufacturers are using today. For example, in the aerospace turbine blade market, they simply cannot touch the part like they used to—the surface finish of the material is too readily affected by any kind of contact metrology."