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IMTS 2016: Zeiss Industrial Metrology Discuss Market Trends and the Big Show

By James D. Sawyer Editor in Chief, SME Media

Guest: David Wick, Manager, Product Management at ZEISS Industrial Metrology. Interviewed by Manufacturing Engineering magazine Editor in Chief Jim Sawyer.

SME’s Advanced Manufacturing Now talks to David Wick, who discusses what ZEISS Industrial Metrology is planning for IMTS and new trends impacting the metrology industry today. We also discuss new products ZEISS Industrial Metrology plans to release in the upcoming months.

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