SME Logo

Manufacturing Knowledge Base



Product Title: Extending Electrical Resistivity Measurements in Micro-Scratching...

Updated from Personify: 2013-08-12

Personify Product Code: TP04PUB227

Personify Product ID:       127177

Personify Shopping Cart URL:


Small Image: 

Large Image: 


Author: Hisham A Abdel-Aal



Published By:

Copyright Year:

Published Date: 2004-07-27

Page Count: 15

Binding Type:

Product Type:   TECHPAPER




Member Price:

Non-Member Price:



This paper describes a procedure by which the average thermal conductivity of the metallic phase of silicon is extracted from electrical resistivity measurements. The procedure is based on teaming a temperature evaluation code to the resistivity measurements thus allowing the extraction of the conductivity as a function of temperature. The results indicate that despite the relatively high thermal conductivity of covalent silicon, the metallic phase is rather insulative. This affects the dynamics of ductile-regime-machining and the diamond turning of semiconductors in general and silicon in particular. Author: Hisham A. Abdel-Aal, University of Wisconsin, Platteville, WI.


Table of Contents:  

Other Related Content (Sample Chapters, etc.): 

Related Products (Cross Sell): 

Related Products IDs (Personify):

Publication URL (for ECD and other linked products) 



Sample Chapters


 Study Guide 
 DVD Outline

Produced By 


Video Length:




Edition: 0


Volume: 0