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WESTEC 2013: Single-Platform Metrology System

SFP1 surface-finish probe option for the REVO five-axis measurement system fully integrates surface finish inspection within coordinate measurement routines with a measurement capability of 6.3–0.05 Ra. The system allows automated switching between dimensional measurement and surface finish measurement with the analysis contained in a single report. The SFP1 probe is supplied with two dedicated styli, straight and cranked. The probe incorporates a C axis that allows the probe tip to be automatically oriented to any angle to suit the part. Using the straight stylus, the SFP1 can perform a measurement trace within a 10-mm diameter bore to a depth of 100 mm. A skidded probe with a 2-µm radius diamond stylus tip, the SFP1 probe outputs Ra, RMS and raw data formats to the metrology application software via Renishaw’s UCCServer software, using the I++ DME protocol.
Renishaw Inc.
Ph: 847-286-9953
Web site:

Published Date : 8/16/2013

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